Doi.org/10.1002/pssc.201600051

Target Article

Stress Relaxation Mechanism in the Si-SiO2 System and Its Influence on the Interface Properties  ; Daniel Kropman Viktor Seeman Sergei Dolgov Ivo Heinmaa Artur Medvid; NULL; 07/19/2016; https://doi.org/10.1002/pssc.201600051

Reasons

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